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A comparative study between Elliptic Fourier and B-spline descriptors for object contour representation

Author
Ferrer-Arnau, Ll.; Parisi, V.; Soria, J.; Nasreddine, Kamal; Benzinou, Abdesslam
Type of activity
Presentation of work at congresses
Name of edition
2014 First International Image Processing, Applications and Systems Conference (IPAS)
Date of publication
2014
Presentation's date
2014-11-07
Book of congress proceedings
2014 First International Image Processing, Applications and Systems Conference (IPAS): procedings
First page
1
Last page
5
DOI
https://doi.org/10.1109/IPAS.2014.7043301 Open in new window
Repository
http://hdl.handle.net/2117/26572 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7043301&isnumber=7043254 Open in new window
Abstract
In this work, a comparative study between Elliptic Fourier and B-spline descriptors is carried out for comparing their efficiency in characterizing the contour shape of image objects. In both cases, the goal is to obtain the least representation error using the fewest possible number of coefficients. With Fourier descriptors, different number of harmonics are used while the remaining ones are set to zero. In the B-spline case, coefficients are obtained iteratively using a least-square filter, fo...
Citation
Ferrer-Arnau, Ll. [et al.]. A comparative study between Elliptic Fourier and B-spline descriptors for object contour representation. A: International Image Processing, Applications and Systems Conference. "2014 First International Image Processing, Applications and Systems Conference (IPAS): procedings". Hammamet: 2014, p. 1-5.
Keywords
Elliptic Fourier, cubic B-splines, image contours, linear B-splines, signal/error ratio
Group of research
DISEN - Distributed Sensor Networks
Electromagnetic Compatibility (EMC); Widebandgap (WBG); Internal Activity; Feature Selective Validation (FSV); Spread Spectrum modulation; Reliability; Multilevel Converters; Fault detection;
PERC-UPC - Power Electronics Research Centre
SARTI - Technological Development Center for Remote Acquisition and Data Processing System

Participants