Go to the content (press return) Navigation
Go to the content (press return)
Modeling technique of the conducted emission of integrated circuit under different temperatures
Berbel, N.; Fernandez-Garcia, R.; Gil, I.
Type of activity
International journal of numerical modeling. Electronic networks devices and fields Date of publication
https://doi.org/10.1002/jnm.2076 Project funding
New electronic design strategies for deployment of wireless sensor netwotks in smart textile
Copyright © 2015 John Wiley & Sons, Ltd. In this paper the temperature impact on conducted emissions of ICs up to 3 GHz has been analyzed. The electromagnetic conducted emissions of a commercial IC clock generator have been characterized and modeled from 293 K to 358 K. A temperature parametrized lumped-electrical equivalent model including the PCB and IC behavior has been developed and validated by means of Feature Selective Validation. The results show that the passive distribution networ...
Berbel, N.; Fernandez-Garcia, R.; Gil, I. Modeling technique of the conducted emission of integrated circuit under different temperatures. "International journal of numerical modeling. Electronic networks devices and fields", 2015.
EMC, FSV, ICEM-CE, conducted emissions, integrated circuit, internal activity, temperature
Group of research
Electromagnetic Compatibility (EMC); Widebandgap (WBG); Internal Activity; Feature Selective Validation (FSV); Spread Spectrum modulation; Reliability; Multilevel Converters; Fault detection; PERC-UPC - Power Electronics Research Centre RFEMC -