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Impact of parameter variations on circuits and microarchitecture

Author
Unsal, O.; Tschanz, J. W.; Bowman, K.; De, V.; Vera, F.J.; Gonzalez, A.; Ergin, O.
Type of activity
Journal article
Journal
IEEE micro
Date of publication
2006-12
Volume
26
Number
6
First page
30
Last page
39
DOI
https://doi.org/10.1109/MM.2006.122 Open in new window
Repository
http://hdl.handle.net/2117/96794 Open in new window
URL
http://ieeexplore.ieee.org/document/4042630/ Open in new window
Abstract
Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches.
Citation
Unsal, O., Tschanz, J. W., Bowman, K., De, V., Vera, F.J., González, A., Ergin, O. Impact of parameter variations on circuits and microarchitecture. "IEEE micro", Desembre 2006, vol. 26, núm. 6, p. 30-39.
Keywords
Circuits, Clocks, Delay, Fluctuations, Frequency, Microarchitecture, Process design, Safety, Temperature, Voltage
Group of research
ARCO - Microarchitecture and Compilers

Participants

  • Unsal, Osman Sabri  (author)
  • Tschanz, James W.  (author)
  • Bowman, Keith  (author)
  • De, Vivek  (author)
  • Vera Rivera, Francisco Javier  (author)
  • Gonzalez Colas, Antonio Maria  (author)
  • Ergin, Oguz  (author)

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