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Characterization of MOSFET temperature sensors for on-chip dynamic thermal measurements

Author
Reverter, F.; Perpinyà, X.; Leon, J.; Vellvehi, M.; Jordà, X.; Altet, J.
Type of activity
Presentation of work at congresses
Name of edition
Eurosensors2015
Date of publication
2015
Presentation's date
2015-09-07
Book of congress proceedings
Procedia Engineering
First page
836
Last page
839
DOI
https://doi.org/10.1016/j.proeng.2015.08.699 Open in new window
Project funding
Multilevel approach to the reliability-aware design of analog and digital integrated circuits
Repository
http://hdl.handle.net/2117/86682 Open in new window
http://www.sciencedirect.com/science/article/pii/S1877705815023620 Open in new window
Citation
Reverter, F., Perpinyà, X., Leon, J., Vellvehi, M., Jordà, X., Altet, J. Characterization of MOSFET temperature sensors for on-chip dynamic thermal measurements. A: Eurosensors. "Procedia Engineering". 2015, p. 836-839.
Keywords
IC testing, MOSFET, temperature sensor, thermal coupling, thermal testing
Group of research
HIPICS - High Performance Integrated Circuits and Systems
e-CAT - Electronic Circuits and Transducers

Participants

  • Reverter Cubarsí, Ferran  (author and speaker )
  • Perpinyà, Xavier  (author and speaker )
  • Leon, Javier  (author and speaker )
  • Vellvehi, Miquel  (author and speaker )
  • Jordà, Xavier  (author and speaker )
  • Altet Sanahujes, Josep  (author and speaker )

Attachments