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Circuit designs for increasing reliability and reducing energy

Type of activity
Theses
Defense's date
2016-02-02
URL
http://hdl.handle.net/2117/96283 Open in new window
Abstract
Computing technology has witnessed an inimitable progress in the last decades which is the result of CMOS technology scaling commensurate with Moore's law. Transistor feature sizes have shrunk to half at each generation, and consequently the number of transistors per chip has doubled each two years. However, power-density problems and the difficulty of eking out more performance from complex out of order single core architectures forced the processor manufacturers to introduce chip multiprocesso...
Group of research
CAP - High Performace Computing Group
Citation
Seyedi, A. "Circuit designs for increasing reliability and reducing energy". Tesi doctoral, UPC, Departament d'Arquitectura de Computadors, 2016.

Participants

  • Seyedi, Azamolsadat  (author)
  • Ergin, Oguz  (chair)
  • Palomar Perez, Oscar  (secretary)
  • Cristal Kestelman, Adrian  (director)
  • Karl, Wolfgang  (president)
  • Unsal, Osman Sabri  (director)

Attachments