FUTUR. Website for the scientific production of UPC researchers.

Figueras Pamies, Juan

Total activity: 322

Research group: CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

E-mail: joan.figuerasupc.edu

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Scientific and technological production

1 to 50 of 322 results

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Postbond test of through-silicon vias with resistive open defects
Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.
IEEE transactions on very large scale integration (VLSI) systems
Vol. 27, num. 11, p. 2596-2607
DOI: 10.1109/TVLSI.2019.2925971
Date of publication: 2019-07-17
Journal article

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Full open defects in nanometric CMOS
Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.
IEEE VLSI Test Symposium
p. 119-124
DOI: 10.1109/VTS.2008.31
Presentation of work at congresses

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SELF-HEALING AND SECURE LOW-POWER MEMORY SYSTEMS
Department of Electronic Engineering, Universitat Politècnica de Catalunya
Theses

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Mixed-Signal Alternate Test and Binning Using Digitally Encoded Signatures
Álvaro Gómez-Pau
Department of Electronic Engineering, Universitat Politècnica de Catalunya
Theses

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Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Journal of Electronic Testing: Theory and Applications (JETTA)
p. 1-14
DOI: 10.1007/s10836-017-5648-y
Date of publication: 2017-02-20
Journal article

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Criteria for selecting a subset of indirect measurements for analog testing
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
p. 1-6
Presentation's date: 2016-11-23
Presentation of work at congresses

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Indirect test of M-S circuits using multiple specification band guarding
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Integration. The VLSI journal
Vol. 55, p. 415-424
DOI: 10.1016/j.vlsi.2016.04.007
Date of publication: 2016-09-01
Journal article

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Efficient production binning using octree tessellation in the alternate measurements space
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
IEEE transactions on computer-aided design of integrated circuits and systems
Vol. 35, num. 8, p. 1386-1395
DOI: 10.1109/TCAD.2015.2501309
Date of publication: 2016-08-01
Journal article

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Best PhD Student Paper Award
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Award or recognition

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Improving indirect test efficiency using multi-directional tessellations in the measure space
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
International Mixed-Signal Testing Workshop
p. 1-6
DOI: 10.1109/IMS3TW.2016.7524230
Presentation's date: 2016-07
Presentation of work at congresses

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Best Paper Award Design of Circuits and Integrated Systems Conference (DCIS2015)
Álvaro Gómez-Pau; Lupon, E.; Balado, L.; Figueras, J.
Award or recognition

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Mixed-Signal Circuits Testing Using Digitally Coded Indirect Measurements
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
Presentation's date: 2015-11-25
Presentation of work at congresses

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Adaptive test system applied to the generation of mixed-signal signatures
Álvaro Gómez-Pau; Lupon, E.; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
p. 7-
Presentation's date: 2015-11-25
Presentation of work at congresses

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Mixed-signal test band guarding using digitally coded indirect measurements
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design
p. 1-4
DOI: 10.1109/SMACD.2015.7301708
Presentation's date: 2015-09-09
Presentation of work at congresses

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Diagnosis of parametric defects in dual axis IC accelerometers
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Microsystem technologies
Vol. 21, num. 9, p. 1855-1866
DOI: 10.1007/s00542-014-2218-4
Date of publication: 2015-09-01
Journal article

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Prebond testing of weak defects in TSVs
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
IEEE transactions on very large scale integration (VLSI) systems
Vol. PP, num. 99, p. 31-36
DOI: 10.1109/TVLSI.2015.2448594
Date of publication: 2015-08-07
Journal article

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Analog circuits testing using digitally coded indirect measurements
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
International Conference on Design & Technology of Integrated Systems in Nanoscale Era
p. 57-62
DOI: 10.1109/DTIS.2015.7127357
Presentation of work at congresses

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STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations
Vatajelu, E.; Rodriguez-Montanes, R.; Indaco, M.; Paolo Prinetto; Figueras, J.
International Conference on Design & Technology of Integrated Systems in Nanoscale Era
p. 1-6
DOI: 10.1109/DTIS.2015.7127377
Presentation of work at congresses

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Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell
Vatajelu, E.; Rodriguez-Montanes, R.; Indaco, M.; Renovell, M.; Paolo Prinetto; Figueras, J.
Design, Automation and Test in Europe Conference and Exhibition
p. 447-452
Presentation of work at congresses

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Power-aware voltage tuning for STT-MRAM reliability
Vatajelu, E.; Rodriguez-Montanes, R.; Stefano Di Carlo; Renovell, M.; Paolo Prinetto; Figueras, J.
IEEE European Test Symposium
p. 1-6
DOI: 10.1109/ETS.2015.7138748
Presentation of work at congresses

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An efficient behavioral description frontend tool for mixed-mode SPICE simulation
Álvaro Gómez-Pau; Balado, L.; Figueras, J.; Chatterjee, A.
Conference on Design of Circuits and Integrated Systems
p. 1-6
Presentation's date: 2014-11-28
Presentation of work at congresses

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Quality metrics for mixed-signal indirect testing
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
p. 1-6
Presentation's date: 2014-11-26
Presentation of work at congresses

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Electrical localisation of full open defects in comb-meander-comb structures
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
Electronics Letters
Vol. 50, num. 23, p. 1682-1683
DOI: 10.1049/el.2014.3104
Date of publication: 2014-11-06
Journal article

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La Promoció 108 compleix 50 anys (1964-2014): història, entorn i records
del Cerro, J.; Cusí, C.; Figueras, J.
Date of publication: 2014-09-01
Book

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Pre-bond testing of weak defects in TSVs
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
IEEE International Symposium on On-Line Testing and Robust System Design
p. 31-36
DOI: 10.1109/IOLTS.2014.6873668
Presentation's date: 2014-07-07
Presentation of work at congresses

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Criteria for indirect measurements in M-S testing
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Workshop on Statistical Test Methods
p. 1-6
Presentation's date: 2014-05-30
Presentation of work at congresses

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Post-Bond test of through-silicon vias with open defects
Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.
IEEE European Test Symposium
p. 1-6
DOI: 10.1109/ETS.2014.6847816
Presentation's date: 2014-05-29
Presentation of work at congresses

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M-S specification binning based on digitally coded indirect measurements
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
IEEE European Test Symposium
p. 105-110
Presentation's date: 2014-05-28
Presentation of work at congresses

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Analysis and improvement techniques for robustness and security of nanometer circuits in the presence of attacks, defects, variability and aging
Manich, S.; Rodriguez-Montanes, R.; Balado, L.; Rius, J.; Lamaison, R.; Renovell, M.; Lupon, E.; Arumi, D.; Weiner, M.; Álvaro Gómez-Pau; Figueras, J.
Competitive project

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Candidate Best Paper Award in Design of Circuits and Integrated Systems Conference (DCIS2014)
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Award or recognition

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Reliability estimation at block-level granularity of spin-transfer-torque MRAMs
Stefano Di Carlo; Indaco, M.; Paolo Prinetto; Vatajelu, E. I.; Rodriguez-Montanes, R.; Figueras, J.
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
p. 75-80
DOI: 10.1109/DFT.2014.6962093
Presentation's date: 2014
Presentation of work at congresses

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SRAM cell stability metric under transient voltage noise
Vatajelu, E. I.; Álvaro Gómez-Pau; Renovell, M.; Figueras, J.
Microelectronics journal
Vol. 45, num. 10, p. 1348-1353
DOI: 10.1016/j.mejo.2013.11.005
Date of publication: 2013-12-20
Journal article

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Test of dual axis accelerometers based on specifications compliance
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
Presentation's date: 2013-11-28
Presentation of work at congresses

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M-S test based on specification validation using octrees in the measure space
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
IEEE European Test Symposium
p. 70-75
DOI: 10.1109/ETS.2013.6569359
Presentation's date: 2013-05-28
Presentation of work at congresses

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Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Design, Test, Integration & Packaging of MEMS/MOEMS
Presentation's date: 2013-04-18
Presentation of work at congresses

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Diagnosis of interconnect full open defects in the presence of gate leakage currents
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
IEEE transactions on computer-aided design of integrated circuits and systems
Vol. 32, num. 2, p. 301-312
DOI: 10.1109/TCAD.2012.2228269
Date of publication: 2013-02
Journal article

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BIST Architecture to Detect Defects in TSVs During Pre-Bond Testing
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
IEEE European Test Symposium
DOI: 10.1109/ETS.2013.6569389
Presentation of work at congresses

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Adaptive self test of defective TSVs
Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
Presentation's date: 2012-11-30
Presentation of work at congresses

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SRAM stability metric under transient noise
Álvaro Gómez-Pau; Renovell, M.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
Presentation's date: 2012-11-30
Presentation of work at congresses

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Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.
Álvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
p. 223-228
Presentation's date: 2012-11-28
Presentation of work at congresses

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Circuito de autotest integrado de TSVs
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
Date of request: 2012-10-09
Invention patent

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Process variability in sub-16nm bulk CMOS technology
Rubio, A.; Figueras, J.; Vatajelu, E.; Canal, R.
Date: 2012-03-01
Report

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Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation
Figueras, J.; Vatajelu, E. I.
Design, Automation and Test in Europe Conference and Exhibition
p. 1343-1348
Presentation's date: 2012
Presentation of work at congresses

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Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
IEEE transactions on computer-aided design of integrated circuits and systems
Vol. 30, num. 12, p. 1911-1922
DOI: 10.1109/TCAD.2011.2165071
Date of publication: 2011-12
Journal article

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Gate leakage impact on full open defects in interconnect lines
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
IEEE transactions on very large scale integration (VLSI) systems
Vol. 19, num. 12, p. 2209-2220
DOI: 10.1109/TVLSI.2010.2077315
Date of publication: 2011-12
Journal article

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Testing dual axis IC accelerometers using Lissajous compositions
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Conference on Design of Circuits and Integrated Systems
p. 1-4
Presentation's date: 2011-11-17
Presentation of work at congresses

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8T SRAM Cell with Open Defects under Voltage and Timing Variations
Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.; Castillo, R.
Conference on Design of Circuits and Integrated Systems
p. 155-160
Presentation's date: 2011-11-16
Presentation of work at congresses

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ROBUSTNESS ANALYSIS OF NANOMETRIC SRAM MEMORIES
Vatajelu, E.
Department of Electronic Engineering, Universitat Politècnica de Catalunya
Theses

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Testing IC accelerometers using Lissajous compositions
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Perspective Technologies and Methods in MEMS Design
p. 75-81
Presentation's date: 2011-05-11
Presentation of work at congresses

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Transient noise failures in SRAM cells : dynamic noise margin metric
Álvaro Gómez-Pau; Renovell, M.; Figueras, J.; Vatajelu, E. I.
Asian Test Symposium
p. 413-418
DOI: 10.1109/ATS.2011.64
Presentation's date: 2011
Presentation of work at congresses

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Figueras Pamies, Juan

Scientific and technological production

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