
Ferral, A.; Scavuzzo, C.; Solorza, R.; Márquez, J.; Salvia, M.; Gómez, L.; Notarnicola, C.; Cigna, F.; López-Martínez, C.; hattacharya, A.; Li, X.; Camps, A.; Frery, A.
IEEE Geoscience and Remote Sensing Magazine
Vol. 7, num. 3, p. 107-109
DOI: 10.1109/MGRS.2019.2933136
Date of publication: 2019-09-23
Journal article