Loading...
Loading...

Go to the content (press return)

MOSFET dynamic thermal sensor for IC testing applications

Author
Reverter, F.; Perpiñà, X.; Barajas, E.; León, J.; Vellvehi, M.; Jordà, X.; Altet, J.
Type of activity
Journal article
Journal
Sensors and actuators A. Physical
Date of publication
2016-05-01
Volume
242
First page
195
Last page
202
DOI
https://doi.org/10.1016/j.sna.2016.03.016 Open in new window
Repository
http://hdl.handle.net/2117/100287 Open in new window
URL
http://www.sciencedirect.com/science/article/pii/S0924424716301145 Open in new window
Abstract
This paper analyses how a single metal-oxide-semiconductor field-effect transistor (MOSFET) can be employed as a thermal sensor to measure on-chip dynamic thermal signals caused by a power-dissipating circuit under test (CUT). The measurement is subjected to two low-pass filters (LPF). The first LPF depends on the thermal properties of the heat-conduction medium (i.e. silicon) and the CUT-sensor distance, whereas the second depends on the electrical properties of the sensing circuit such as the ...
Citation
Reverter, F., Perpiñà, X., Barajas, E., León, J., Vellvehi, M., Jordà, X., Altet, J. MOSFET dynamic thermal sensor for IC testing applications. "Sensors and actuators A. Physical", 1 Maig 2016, vol. 242, p. 195-202.
Keywords
BIPOLAR-TRANSISTORS, DETECTOR, IC testing, INTEGRATED-CIRCUITS, MOSFET, RF testing, TEMPERATURE SENSORS, Temperature sensor, Thermal coupling, Thermal testing
Group of research
HIPICS - High Performance Integrated Circuits and Systems
e-CAT - Electronic Circuits and Transducers

Participants

Attachments