Loading...
Loading...

Go to the content (press return)

A detailed methodology to compute soft error rates in advanced technologies

Author
Riera, M.; Canal, R.; Abella, J.; Gonzalez, A.
Type of activity
Presentation of work at congresses
Name of edition
19th Design, Automation and Test in Europe Conference and Exhibition
Date of publication
2016
Presentation's date
2016-03
Book of congress proceedings
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE): 14-18 March 2016, ICC, Dresden, Germany
First page
217
Last page
222
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Repository
http://hdl.handle.net/2117/98176 Open in new window
URL
http://ieeexplore.ieee.org/document/7459307/ Open in new window
Abstract
System reliability has become a key design aspect for computer systems due to the aggressive technology miniaturization. Errors are typically dominated by transient faults due to radiation and are strongly related to the technology used to build hardware. However, there is a lack of detailed methodologies to model and fairly compare Soft Error Rates (SER) across different advanced technologies. This work first describes a common methodology that from (1) technology models, (2) location (latitude...
Citation
Riera, M., Canal, R., Abella, J., Gonzalez, A. A detailed methodology to compute soft error rates in advanced technologies. A: Design, Automation & Test in Europe Conference & Exhibition. "Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE): 14-18 March 2016, ICC, Dresden, Germany". Dresden: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 217-222.
Keywords
Advanced technology, Circuit description, Error correction, Future technologies, Operating condition, Radiation hardening, Reconfigurable hardware, Soft error rate, System reliability, Through current, Transient faults
Group of research
ARCO - Microarchitecture and Compilers
VIRTUOS - Virtualisation and Operating Systems

Participants