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Temperature sensors and measurements to test analogue circuits: questions and answers

Author
Altet, J.; Rubio, A.; Reverter, F.; Perpiñà, X.; Aragones, X.; Jordà, X.; Vellvehi, M.; Mateo, D.
Type of activity
Presentation of work at congresses
Name of edition
21st International Mixed-Signal Testing Workshop
Date of publication
2016
Presentation's date
2016-07
Book of congress proceedings
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016
First page
1
Last page
5
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/IMS3TW.2016.7524241 Open in new window
Repository
http://hdl.handle.net/2117/97135 Open in new window
URL
http://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/stamp/stamp.jsp?arnumber=7524241 Open in new window
Abstract
We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many interesting questions, some of them collected more than once!. Here you have some of them. Our goal in this paper is to introduce temperature measurements and temperature sensors to test analog circuits from the highest level of abstraction. This paper has been written with the go...
Citation
Altet, J., Rubio, A., Reverter, F., Perpiñà, X., Aragones, X., Jordà, X., Vellvehi, M., Mateo, D. Temperature sensors and measurements to test analogue circuits: questions and answers. A: International Mixed-Signal Testing Workshop. "2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016.
Keywords
Analogue circuits, Integrated circuit testing, Integrated circuits, Temperature measurement, Temperature measurements, Temperature sensors
Group of research
HIPICS - High Performance Integrated Circuits and Systems
e-CAT - Electronic Circuits and Transducers

Participants