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Memristive crossbar memory lifetime evaluation and reconfiguration strategies

Author
Pouman, P.; Amat, E.; Rubio, A.
Type of activity
Journal article
Journal
IEEE Transactions on emerging topics in computing
Date of publication
2016-06-20
Volume
6
Number
2
First page
207
Last page
218
DOI
https://doi.org/10.1109/TETC.2016.2581700 Open in new window
Repository
http://hdl.handle.net/2117/90560 Open in new window
URL
http://ieeexplore.ieee.org/document/7494670/ Open in new window
Abstract
Among the emerging technologies and devices for highly scalable and low power memory architectures, memristors are considered as one of the most favorable alternatives for next generation memory technologies. They are attracting great attention recently, due to their many appealing characteristics such as non-volatility and compatibility with CMOS fabrication process. But beside all memristor advantages, their drawbacks including manufacturing process variability and limited read/write endurance...
Citation
Pouman, P., Amat, E., Rubio, A. Memristive crossbar memory lifetime evaluation and reconfiguration strategies. "IEEE Transactions on emerging topics in computing", 20 Juny 2016, vol. 6, núm. 2, p. 207-218.
Keywords
Crossbar, Endurance degradation, Memristor, Process variability, RRAM, Reconfiguration, Reliability
Group of research
HIPICS - High Performance Integrated Circuits and Systems

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