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Monitoring SRAM BTI degradation by current-based tracking technique

Author
Pouyan, P.; Amat, Esteve; Rubio, A.
Type of activity
Presentation of work at congresses
Name of edition
14th IEEE International New Circuits and Systems Conference
Date of publication
2016
Presentation's date
2016-06
Book of congress proceedings
2016 14th IEEE International New Circuits and Systems Conference (NEWCAS)
First page
1
Last page
4
DOI
https://doi.org/10.1109/NEWCAS.2016.7604766 Open in new window
Abstract
The scaling of CMOS technologies towards nano-scale size nodes brings up critical design challenges such as parameter variability mitigation and device aging control along the chip lifetime. The combination of these phenomena leads to a time-dependent variability of the electrical properties of the device, which can significantly impact the performance, yield and reliability of the circuits and systems. This work aims for presenting a novel on-chip aging sensor in order to monitor the aging prof...
Keywords
SRAM BTI degradation monitoring, SRAM chips, adaptive proactive reconfiguration approach, aging profile, chip lifetime, current-based tracking technique, device aging control, electrical properties, integrated circuit reliability, nanoscale size nodes, on-chip aging sensor, parameter variability mitigation, reliability enhancement strategy, sensors, time-dependent variability
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants

  • Pouyan, Peyman  (author and speaker )
  • Amat Bertran, Esteve  (author and speaker )
  • Rubio Sola, Jose Antonio  (author and speaker )