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MASkIt: soft error rate estimation for combinatorial circuits

Author
Anglada, M.; Canal, R.; Aragon, J.; Gonzalez, A.
Type of activity
Presentation of work at congresses
Name of edition
34th IEEE International Conference on Computer Design
Date of publication
2016
Presentation's date
2016-10-03
Book of congress proceedings
Proceedings of the 34th IEEE International Conference on Computer Design (ICCD): October 2-5, 2016: Scottsdale, AZ, USA
First page
614
Last page
621
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/ICCD.2016.7753348 Open in new window
Repository
http://hdl.handle.net/2117/97620 Open in new window
URL
http://ieeexplore.ieee.org/document/7753348/ Open in new window
Abstract
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error rate (SER) estimation has become an important and very challenging goal. In this work, a novel approach for SER estimation of combinational circuits is presented. The proposed framework is divided in two stages. First, signal probabilities are computed via a hybrid approach combining heuristics and selective simulation of reconvergent subnets. In the second stage, signal probabilities are used to...
Citation
Anglada, M., Canal, R., Aragon, J., Gonzalez, A. MASkIt: soft error rate estimation for combinatorial circuits. A: IEEE International Conference on Computer Design. "Proceedings of the 34th IEEE International Conference on Computer Design (ICCD): October 2-5, 2016: Scottsdale, AZ, USA". Scottsdale, AZ: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 614-621.
Keywords
Algorithm design and analysis, Circuit faults, Error analysis, Estimation, Heuristic algorithms, Integrated circuit modeling, Logic gates
Group of research
ARCO - Microarchitecture and Compilers
VIRTUOS - Virtualisation and Operating Systems

Participants