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Wearing a single DNA molecule with an AFM tip

Santos, S.; Barcons, V.; Font, J.; Thomson, N.
Tipus d'activitat
Document cientificotècnic
Repositori Obrir en finestra nova
URL Obrir en finestra nova
While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the difficulty in characterizing the tip, and in particular a lack of reliable methods that can achieve this in situ. Here, we provide an in situ method to characterize the tip radius and monitor tip creep and/or wear and biomolecular sample wear in ambient dynamic ...
Santos, S., Barcons, V., Font, J., Thomson, N. "Wearing a single DNA molecule with an AFM tip". 2015.
Paraules clau
Atomic force microscopy, Attractive, Critical amplitude, DNA, Mica, Repulsive
Grup de recerca
CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
PERC-UPC - Centre de Recerca d'Electrònica de Potència UPC
SSR-UPC - Smart Sustainable Resources