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IEEE Journal of the Electron Devices Society
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IEEE Journal of the Electron Devices Society
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ISSN
2168-6734
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New York, NY : Institute of Electrical and Electronics Engineers, Inc., 2013-
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Institute of Electrical and Electronics Engineers (IEEE)
URL
http://eds.ieee.org/journal-of-the-electron-devices-society.html
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Origin of the negative differential resistance in the output characteristics of a picene-based thin-film transistor
Ros, E.; Puigdollers, J.; Ortega, P.; Voz, C.
IEEE Journal of the Electron Devices Society
DOI: 10.1109/JEDS.2020.2965213
Date of publication: 2020-01-09
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2020
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Ortega Villasclaras, Pablo Rafael
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Puigdollers Gonzalez, Joaquin
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Ros Costals, Eloi
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MNT - Micro and Nanotechnologies Research Group
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