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Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction

Autor
Ochoa, D. A.; Levit, R.; Fancher, C.M.; Esteves, G.; Jones, J.L.; Garcia, J. E.
Tipus d'activitat
Article en revista
Revista
Journal of Physics D: Applied Physics
Data de publicació
2017-04-26
Volum
50
Número
20
Pàgina inicial
205305-1
Pàgina final
205305-14
DOI
https://doi.org/10.1088/1361-6463/aa6b9e Obrir en finestra nova
Projecte finançador
Relevancia funcional de la nanoestructura en las propiedades de cerámicas de diseño seguro
Repositori
http://hdl.handle.net/2117/103927 Obrir en finestra nova
URL
http://iopscience.iop.org/article/10.1088/1361-6463/aa6b9e/meta;jsessionid=CEDCA39C475F98C7138BD7167D36A06A.c2.iopscience.cld.iop.org Obrir en finestra nova
Resum
Ordinary ferroelectrics exhibit a second order phase transition that is characterized by a sharp peak in the dielectric permittivity at a frequency-independent temperature. Furthermore, these materials show a low temperature dielectric relaxation that appears to be a common behavior of perovskite systems. Tetragonal lead zirconate titanate is used here as a model system in order to explore the origin of such an anomaly, since there is no consensus about the physical phenomenon involved in it. Cr...
Citació
Ochoa, D. A., Levit, R., Fancher, C.M., Esteves, G., Jones, J.L., Garcia, J. E. Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction. "Journal of Physics D: Applied Physics", 26 Abril 2017, vol. 50, núm. 20, p. 205305-1-205305-14.
Paraules clau
dielectric relaxation, dielectric response, ferroelectrics, piezoelectric materials
Grup de recerca
CEMAD - Caracterització Elèctrica de Materials i Dispositius

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