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Mixed-Signal Alternate Test and Binning Using Digitally Encoded Signatures

Author
Álvaro Gómez-Pau
Type of activity
Theses
Other related units
Department of Electronic Engineering
Defense's date
2017-07-11
URL
http://hdl.handle.net/2117/111508 Open in new window
Abstract
Integrated circuit industry has always faced the necessity of testing and verifying the fabricated ICs in order to guarantee that no faulty circuits reach the market as well as the fabricated devices function within design specifications throughout their entire service life. In the current frame, the accomplishment of this objective entangles considerable economic implications and great technological challenges. Analog and mixed-signal circuit testing becomes an even more challenging endeavor si...
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs
Citation
Gómez Pau, Á. "Mixed-signal alternate test and binning using digitally encoded signatures". Tesi doctoral, UPC, Departament d'Enginyeria Electrònica, 2017.

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