Loading...
Loading...

Go to the content (press return)

Second order sigma-delta control of charge trapping for MOS capacitors

Author
Bheesayagari, C.; Gorreta, S.; Pons, J.; Dominguez, M.
Type of activity
Journal article
Journal
Microelectronics reliability
Date of publication
2017-09-01
Volume
76-77
First page
635
Last page
639
DOI
https://doi.org/10.1016/j.microrel.2017.06.096 Open in new window
Repository
http://hdl.handle.net/2117/115875 Open in new window
URL
http://www.sciencedirect.com/science/article/pii/S0026271417302846?via%3Dihub Open in new window
Abstract
This paper presents the circuit topology of a second order sigma-delta control of charge trapping for MOS capacitors. With this new topology it is possible to avoid the presence of plateaus that can be found in first-order sigma-delta modulators. Plateaus are unwanted phenomena in which the control is locked for a certain time interval (of unknown duration). In this case the control output is constant and therefore the controlled device is in fact in open-loop configuration. It is shown that the...
Citation
Bheesayagari, C., Gorreta, S., Pons, J., Dominguez, M. Second order sigma-delta control of charge trapping for MOS capacitors. "Microelectronics reliability", 1 Setembre 2017, vol. 76-77, p. 635-639.
Keywords
Charge trapping, Dielectric charging, MOS, Sigma-delta, Sliding mode control
Group of research
MNT - Micro and Nanotechnologies Research Group

Participants