
Ortega, P.; Piñol, J.; Martin, I.; Orpella, A.; Masmitja, G.; Lopez, G.; Ros, E.; Voz, C.; Puigdollers, J.; Alcubilla, R.
IEEE transactions on instrumentation and measurement
Vol. 69, num. 9, p. 6429-6435
DOI: 10.1109/TIM.2020.2967136
Date of publication: 2020-09-01
Journal article