Loading...
Loading...

Go to the content (press return)

Design and validation of a platform for electromagnetic fault injection

Author
Balasch, J.; Arumi, D.; Manich, S.
Type of activity
Presentation of work at congresses
Name of edition
XXXII Conference on Design of Circuits and Integrated Systems
Date of publication
2017
Presentation's date
2017-11-22
Book of congress proceedings
32nd Conference on Design of Circuits and Integrated Systems, DCIS 2017: proceedings, November 22nd-24th 2017, Barcelona
First page
1
Last page
6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/DCIS.2017.8311630 Open in new window
Project funding
Analysis and improvement techniques for robustness and security of nanometer circuits in the presence of attacks, defects, variability and aging
Repository
http://hdl.handle.net/2117/116688 Open in new window
URL
http://ieeexplore.ieee.org/document/8311630/ Open in new window
Abstract
Security is acknowledged as one of the main challenges in the design and deployment of embedded circuits. Devices need to operate on-the-field safely and correctly, even when at physical reach of potential adversaries. One of the most powerful techniques to compromise the correct functioning of a device are fault injection attacks. They enable an active adversary to trigger errors on a circuit in order to bypass security features or to gain knowledge of security-sensitive information. There are ...
Citation
Balasch, J., Arumi, D., Manich, S. Design and validation of a platform for electromagnetic fault injection. A: Conference on Design of Circuits and Integrated Systems. "Design of Circuits and Integrated Systems (DCIS), 2017 32nd Conference on". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 1-6.
Keywords
8-bit microcontrollers, Cryptographic key, Cryptography, Electromagnetic Fault injections, Electromagnetic pulse, Embedded circuits, Encryption operations, Fault injection attacks, Integrated control, Network security, Security features, Sensitive informations, Software testing
Group of research
QINE - Low Power Design, Test, Verification and Security ICs

Participants

Attachments