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Random Bit Generation Based on The Association of Serial CBRAM Devices

Author
Arumi, D.; Manich, S.; Rodriguez-Montanes, R.
Type of activity
Presentation of work at congresses
Name of edition
TRUDEVICE 2018 - Trustworthy Manufacturing and Utilization of Secure Devices
Date of publication
2018
Presentation's date
2018-03-22
Abstract
The serial combination of two CBRAM cells is analyzed for the generation of random bits. Experimental measurements confirm that an unpredictable switch of one of the two devices is obtained during a serial reset operation. Furthermore, it is shown that the same device switches during subsequent set and reset operations. This behavior confirm the potential application of this memristive based configuration for hardware security purposes.
Keywords
CBRAM, Memristor, Random Bit Generation
Group of research
QINE - Low Power Design, Test, Verification and Security ICs

Participants