Random Bit Generation Based on The Association of Serial CBRAM Devices
Arumi, D.; Manich, S.; Rodriguez-Montanes, R.
Type of activity
Presentation of work at congresses
Name of edition
TRUDEVICE 2018 - Trustworthy Manufacturing and Utilization of Secure Devices
Date of publication
The serial combination of two CBRAM cells is
analyzed for the generation of random bits. Experimental
measurements confirm that an unpredictable switch of one of the
two devices is obtained during a serial reset operation.
Furthermore, it is shown that the same device switches during
subsequent set and reset operations. This behavior confirm the
potential application of this memristive based configuration for
hardware security purposes.