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Exploratory data analysis on stochastic emissions near-field scanning measurements

Author
Oliva, José A.; Azpurua, M. A.; Pous, M.; Silva, F.; Baharuddin, M.; Smartt, C.; Thomas, D.
Type of activity
Presentation of work at congresses
Name of edition
International Symposium on Electromagnetic Compatibility 2018
Date of publication
2018
Presentation's date
2018-08-27
Book of congress proceedings
2018 International Symposium on Electromagnetic Compatibility: 27-30 August 2018, Amsterdam, the Netherlands
First page
567
Last page
572
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
10.1109/EMCEurope.2018.8485066
Repository
http://hdl.handle.net/2117/132717 Open in new window
URL
https://ieeexplore.ieee.org/document/8485066/keywords#keywords Open in new window
Abstract
Recently, near-field scanning techniques for measuring and analysing stochastic emissions have been theoretically and experimentally studied and they are promising in terms of the characterization and classification radiated emissions in densely integrated technologies. Nonetheless, one of their drawbacks is the volume of data generated by time-domain acquisitions made across the scanning grid. Moreover, there are a multiplicity of sources of systematic errors that can pass unnoticed in measurem...
Citation
Oliva, J. A. [et al.]. Exploratory data analysis on stochastic emissions near-field scanning measurements. A: International Symposium on Electromagnetic Compatibility. "2018 International Symposium on Electromagnetic Compatibility: 27-30 August 2018, Amsterdam, the Netherlands". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 567-572.
Keywords
Data handling, Electromagnetic compatibility, Electromagnetic field measurement, Exploratory data analysis, Information analysis, Integrated technologies, Near field scanning measurements, Near-field scanning, Radiated emissions, Scanning, Statistical criterion, Stochastic field, Stochastic fields, Stochastic systems, Systematic errors, Time domain analysis, Time domain measurement, Time-domain measurements
Group of research
GCEM - Electromagnetic Compatibility Group
IEB - Electronic and Biomedical Instrumentation

Participants