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Utilización de un Sensor IDDQ de Test de Corriente para Determinar el Consumo Medio en un Circuito Integrado

Author
Manich, S.
Type of activity
Presentation of work at congresses
Name of edition
X Congreso de Diseño de Circuitos Integrados y Sistemas
Date of publication
1995
Presentation's date
1995-11-15
Group of research
QINE - Low Power Design, Test, Verification and Security ICs

Participants