The design of a Microstrip Test Fixture for TRL calibration, based on mobile, precisely positioned coax-to-microstrip transitions, is described. Experimental results for the measurement of GaAs FET and HEMT chips S-parameters in the 1-40 GHz frequency band are presented, and compared with the manufacturer's available data. Theoretical considerations and experimental results for the repeatability of transitions, based on a useful "error box" model, are also presented.
Pradell, L., Sabater, C., Artal, E., Comeron, A., Bara, F., Corbella, I., Fortuny, J. TRL calibration applied to the measurement of chip transistor s-parameters up to 40 ghz. A: European Microwave Conference. "EuMc 1990 - 20th European Microwave Conference: Monday 10th to Thursday 13th September 1990: Duna Inter-Continental Hotel, Budapest, Hungary". Budapest: Institute of Electrical and Electronics Engineers (IEEE), 1990, p. 214-219.