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TRL calibration applied to the measurement of chip transistor s-parameters up to 40 ghz

Author
Pradell, L.; Sabater, C.; Artal Latorre, Eduardo; Comeron, A.; Bara, F.; Corbella, I.; Fortuny, J.
Type of activity
Presentation of work at congresses
Name of edition
20th European Microwave Conference
Date of publication
1990
Presentation's date
1990-09
Book of congress proceedings
EuMc 1990 - 20th European Microwave Conference: Monday 10th to Thursday 13th September 1990: Duna Inter-Continental Hotel, Budapest, Hungary
First page
214
Last page
219
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/EUMA.1990.336046 Open in new window
Repository
http://hdl.handle.net/2117/84803 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4136003 Open in new window
Abstract
The design of a Microstrip Test Fixture for TRL calibration, based on mobile, precisely positioned coax-to-microstrip transitions, is described. Experimental results for the measurement of GaAs FET and HEMT chips S-parameters in the 1-40 GHz frequency band are presented, and compared with the manufacturer's available data. Theoretical considerations and experimental results for the repeatability of transitions, based on a useful "error box" model, are also presented.
Citation
Pradell, L., Sabater, C., Artal, E., Comeron, A., Bara, F., Corbella, I., Fortuny, J. TRL calibration applied to the measurement of chip transistor s-parameters up to 40 ghz. A: European Microwave Conference. "EuMc 1990 - 20th European Microwave Conference: Monday 10th to Thursday 13th September 1990: Duna Inter-Continental Hotel, Budapest, Hungary". Budapest: Institute of Electrical and Electronics Engineers (IEEE), 1990, p. 214-219.
Keywords
Calibration, Coaxial components, Frequency measurement
Group of research
CommSensLab-UPC - Centre Específic de Recerca en Comunicació i Detecció UPC
RF&MW - Laboratory of RF & microwave systems, devices and materials
RSLAB - Remote Sensing Lab

Participants