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Penelope: The NBTI-aware processor

Author
Abella, J.; Vera, F.J.; Gonzalez, A.
Type of activity
Presentation of work at congresses
Name of edition
40th Annual IEEE/ACM International Symposium on Microarchitecture
Date of publication
2007
Presentation's date
2007
Book of congress proceedings
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
First page
85
Last page
96
Publisher
IEEE Computer Society
DOI
https://doi.org/10.1109/MICRO.2007.11 Open in new window
Repository
http://hdl.handle.net/2117/101308 Open in new window
URL
http://ieeexplore.ieee.org/document/4408247/ Open in new window
Abstract
Transistors consist of lower number of atoms with every technology generation. Such atoms may be displaced due to the stress caused by high temperature, frequency and current, leading to failures. NBTI (negative bias temperature instability) is one of the most important sources of failure affecting transistors. NBTI degrades PMOS transistors whenever the voltage at the gate is negative (logic input Transistors consist of lower number of atoms with every technology generation. Such atoms may be d...
Citation
Abella, J., Vera, X., González, A. Penelope: The NBTI-aware processor. A: Annual IEEE/ACM International Symposium on Microarchitecture. "Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture". Chicago, IL: IEEE Computer Society, 2007, p. 85-96.
Keywords
Combinational blocks, NBTI-aware processor, Negative bias temperature instability, PMOS transistors, Penelope, Reduced degradation, Storage blocks
Group of research
ARCO - Microarchitecture and Compilers

Participants

  • Abella Ferrer, Jaume  (author and speaker )
  • Vera Rivera, Francisco Javier  (author and speaker )
  • Gonzalez Colas, Antonio Maria  (author and speaker )

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