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Full open defects under tunnelling leakage current in nanometric CMOS

Author
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
Type of activity
Presentation of work at congresses
Name of edition
IEEE VLSI Test Symposium
Date of publication
2008
Presentation's date
2008-04-28
Book of congress proceedings
Proceedings of the VLSI Test Symposium 2008
First page
119
Last page
124
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

Participants