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Analysis of the noise and parameter variations-tolerance of the averaging cell

Author
Martorell, F.; Rubio, A.; Cotofana, S.
Type of activity
Presentation of work at congresses
Name of edition
NANOARCH 2005 - IEEE International Workshop on Design and Test of Defect-Tolerant Nanoscale Architectures
Date of publication
2005
Book of congress proceedings
NANOARCH 2005 - IEEE International Workshop on Design and Test of Defect-Tolerant Nanoscale Architectures
First page
75
Last page
79
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants

  • Martorell Cid, Ferran  (author and speaker )
  • Rubio Sola, Jose Antonio  (author and speaker )
  • Cotofana, S  (author and speaker )