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Automated test system for the characterization of switching regulators using vxi instrumentation

Author
Manuel, A.; Robert, F. J.; Ramos, R.; Guinjoan, F.
Type of activity
Presentation of work at congresses
Name of edition
IMTC'96 IEEE Instrumentation and Measurement Technology Conference
Date of publication
1996
Book of congress proceedings
IEEE Instrumentation and Measurement Technology Conference: Proceedings
First page
187
Last page
191
Group of research
EPIC - Energy Processing and Integrated Circuits
PERC-UPC - Power Electronics Research Centre
SARTI - Technological Development Center for Remote Acquisition and Data Processing System
e-CAT - Electronic Circuits and Transducers

Participants