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On-line failure detection and confinement in caches

Author
Abella, J.; Chaparro, P.; Vera, F.J.; Carretero, J.S.; Gonzalez, A.
Type of activity
Presentation of work at congresses
Name of edition
14th IEEE International On-Line Testing Symposium
Date of publication
2008
Presentation's date
2008-07
Book of congress proceedings
14th IEEE International On-Line Testing Symposium: Rhodes, Greece, July 6–9, 2008: proceedings
First page
3
Last page
9
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/IOLTS.2008.15 Open in new window
Repository
http://hdl.handle.net/2117/101286 Open in new window
URL
http://ieeexplore.ieee.org/document/4567052/ Open in new window
Abstract
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which increases in-the-field error rate due to both latent defects and actual errors. As a consequence, there is an increasing need for continuous on-line testing techniques to cope with hard errors in the field. Similarly, those techniques are needed for detecting soft errors in logic, whose error rate is expected to raise in future technologies. Cache memories, which occupy most of the area of the chip, ...
Citation
Abella, J., Chaparro, P., Vera, X., Carretero, J.S., González, A. On-line failure detection and confinement in caches. A: IEEE International On-Line Testing Symposium. "14th IEEE International On-Line Testing Symposium: Rhodes, Greece, July 6–9, 2008: proceedings". Rhodes: Institute of Electrical and Electronics Engineers (IEEE), 2008, p. 3-9.
Keywords
Cache memory, Costs, Error analysis, Error correction codes, Fault detection, Hardware, Logic, Protection, Testing, Wires
Group of research
ARCO - Microarchitecture and Compilers

Participants

  • Abella Ferrer, Jaume  (author and speaker )
  • Chaparro, Pedro  (author and speaker )
  • Vera Rivera, Francisco Javier  (author and speaker )
  • Carretero Casado, Javier Sebastian  (author and speaker )
  • Gonzalez Colas, Antonio Maria  (author and speaker )

Attachments