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Impact of Gate Leakage Currents on Full Open Defects in SRAM Cells

Author
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
Type of activity
Presentation of work at congresses
Name of edition
XXIII Conference on Design of Circuits and Integrated Systems
Date of publication
2008
Presentation's date
2008-11-12
Book of congress proceedings
Design of Circuits and Integrated Systems
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

Participants