Loading...
Loading...

Go to the content (press return)

Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect

Author
Perpiñà, X.; Altet, J.; Jordà, X.; Vellvehi, M.; Mestres, N.
Type of activity
Journal article
Journal
Optics letters
Date of publication
2010
Volume
35
Number
15
First page
2657
Last page
2659
DOI
https://doi.org/10.1364/OL.35.002657 Open in new window
Repository
http://hdl.handle.net/2117/10951 Open in new window
URL
http://www.opticsinfobase.org/abstract.cfm?uri=ol-35-15-2657 Open in new window
Abstract
This Letter presents a solution for locating hot spots in active integrated circuits (IC) and devices. This method is based on sensing the phase lag between the power periodically dissipated by a device integrated in an IC (hot spot) and its corresponding thermal gradient into the chip substrate by monitoring the heat-induced refractive index gradient with a laser beam. The experimental results show a high accuracy and prove the suitability of this technique to locate and characterize devices be...
Citation
Perpiñà, X. [et al.]. Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect. "Optics Letters", 2010, vol. 35, núm. 15, p. 2657-2659.
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants

  • Perpiñà Gilabet, Xavier  (author)
  • Altet Sanahujes, Josep  (author)
  • Jordà, Xavier  (author)
  • Vellvehi, Miquel  (author)
  • Mestres Andreu, Narcís  (author)

Attachments