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Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors

Author
Bheesayagari, C.; Pons, J.; Orpella, A.; Véliz, B.; Bermejo, S.; Dominguez, M.
Type of activity
Journal article
Journal
(0013-4686) Electrochimica acta
Date of publication
2020-06-20
Volume
346
First page
136202:1
Last page
136202:9
DOI
10.1016/j.electacta.2020.136202
Project funding
ESA AO/1e8876/17/NL/CRS - Miniaturized sensor packages and delivery systems for in-situ exploration
lnstrumentation for characterizing the Martian environment in NASA missions: wind sensors for MEDA (conclusion of phases D and E)
Repository
http://hdl.handle.net/2117/191726 Open in new window
URL
https://www.sciencedirect.com/science/article/pii/S0013468620305946 Open in new window
Abstract
The objective of this paper is to present a charge trapping control method for MIM capacitors in whichthe dielectric is made of electrospray-deposited silica nanoparticles. The influence of the bias voltage onthe impedance spectra of the devices is analyzed, as well as the main conduction mechanisms along thestructure. The control method allows to monitor and control the long term drifts in the impedance ofthese devices, which are a result of the applied bias voltages. © <2020>. This manuscript...
Citation
Bheesayagari, C. [et al.]. Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors. "(0013-4686) Electrochimica acta", 20 Juny 2020, vol. 346, p. 136202:1-136202:9.
Keywords
Charge control, Electrospray, MIM capacitors, Sigma-delta control, Silica nanospheres
Group of research
MNT - Micro and Nanotechnologies Research Group

Participants