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Factors influencing the successful validation of transient phenomenon modelling

Author
Jauregui, R.; Silva, F.; Orlandi, A.; Sasse, H.; Duffy, A.
Type of activity
Presentation of work at congresses
Name of edition
The 2010 Asia-Pacific Electromagnetic Compatibility Symposium and Technical Exhibition
Date of publication
2010
Presentation's date
2010-04-16
Book of congress proceedings
The 2010 Asia-Pacific Electromagnetic Compatibility Symposium and Technical Exhibition
First page
338
Last page
341
Publisher
IEEE Press. Institute of Electrical and Electronics Engineers
DOI
https://doi.org/10.1109/APEMC.2010.5475513 Open in new window
Repository
http://hdl.handle.net/2117/10168 Open in new window
URL
http://ieeexplore.ieee.org/document/5475513/?arnumber=5475513 Open in new window
Abstract
An increased requirement for validation of computational electromagnetic simulation and modelling through the publication of IEEE Standard 1597.1 brings to light some interesting issues surrounding the validation of transients. The structure of a transient event has three particular regions of interest that can have an influence on the results, of which only two are generally well defined. These are the initial quiescent phase from t = 0 to the transient event; the transient event itself up to t...
Citation
Jauregui, R. [et al.]. Factors influencing the successful validation of transient phenomenon modelling. A: Asia-Pacific International Symposium on Electromagnetic Compatibility. "The 2010 Asia-Pacific Electromagnetic Compatibility Symposium and Technical Exhibition". Beijing: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 338-341.
Group of research
GCEM - Electromagnetic Compatibility Group
IEB - Electronic and Biomedical Instrumentation

Participants

  • Jauregui Telleria, Ricardo  (author and speaker )
  • Silva Martinez, Fernando  (author and speaker )
  • Orlandi, Antonio  (author and speaker )
  • Sasse, Hugh  (author and speaker )
  • Duffy, Alistair P.  (author and speaker )

Attachments