Loading...
Loading...

Go to the content (press return)

IEEE transactions on pattern analysis and machine intelligence

Total activity: 1
Additional title
IEEE Xplore
ISSN
0162-8828 Open in new window
Publication / Production
Los Alamitos, CA : IEEE Computer Society, 1988-
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
URL
https://ieeexplore.ieee.org/servlet/opac?punumber=34 Open in new window

Scientific and technological production

1 to 1 of 1 results
 
  • Non-rigid graph registration using active testing search  Open access

     Serradell, E.; Amável , M.; Sznitman, R.; Kybic, J.; Moreno-Noguer, F.; Fua, P.
    IEEE transactions on pattern analysis and machine intelligence
    Vol. 37, num. 3, p. 625-638
    DOI: 10.1109/TPAMI.2014.2343235
    Date of publication: 2015
    Journal article
    Loading...
    Access to the full text