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IEEE transactions on pattern analysis and machine intelligence

Total activity: 2
Additional title
IEEE Xplore
ISSN
0162-8828 Open in new window
Publication / Production
Los Alamitos, CA : IEEE Computer Society, 1988-
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
URL
https://ieeexplore.ieee.org/servlet/opac?punumber=34 Open in new window

Scientific and technological production

1 to 2 of 2 results
 
  • Boosted random ferns for object detection  Open access

     Villamizar, M.A.; Andrade-Cetto, J.; Sanfeliu, A.; Moreno-Noguer, F.
    IEEE transactions on pattern analysis and machine intelligence
    Vol. 40, num. 2, p. 272-288
    DOI: 10.1109/TPAMI.2017.2676778
    Date of publication: 2018-02-01
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  • Exhaustive linearization for robust camera pose and focal length estimation  Open access

     Peñate, A.; Andrade-Cetto, J.; Moreno-Noguer, F.
    IEEE transactions on pattern analysis and machine intelligence
    Vol. 35, num. 10, p. 2387-2400
    DOI: 10.1109/TPAMI.2013.36
    Date of publication: 2013
    Journal article
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