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Takagi-Sugeno fuzzy model to approximate mosfet capacitance for VRM applications

Author
López, T.; Alarcon, E.; Guinjoan, F.; Poveda, A.
Type of activity
Presentation of work at congresses
Name of edition
2010 IEEE International Symposium on Circuits and Systems
Date of publication
2010
Book of congress proceedings
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010): Paris, France: 30 May-2 June 2010
First page
613
Last page
616
DOI
https://doi.org/10.1109/ISCAS.2010.5537519 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05537519 Open in new window
Abstract
The Takagi-Sugeno (TSK) fuzzy model has been extensively used in control applications because of its capability to efficiently approximate multidimensional characteristics. Its application to model circuits and devices has been hitherto reduced, despite its potential benefits. This work is devoted to model by means of TSK scheme the nonlinear characteristics of power MOSFET capacitances to evaluate its impact in the efficiency of Voltage Regulator Modules (VRM) targeting microprocessor supply. A...
Group of research
EPIC - Energy Processing and Integrated Circuits
PERC-UPC - Power Electronics Research Centre

Participants