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Aportación a la modelación del defecto de ruptura de oxido delgado en circuitos CMOS de muy alto nivel de integración (VLSI).

Author
Segura Fuster, Jaume Agapit
Type of activity
Theses
Other related units
Department of Electronic Engineering
Defense's date
1992-12-16
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants