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Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization

Author
Altet, J.; Aldrete, H.E.; Aldrete-Vidrio, E.; Mateo, D.; Salhi, A.; Grauby, S.; Claeys, W.
Type of activity
Journal article
Journal
Review of scientific instruments
Date of publication
2009-02
Volume
80
Number
026101
First page
1
Last page
1
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants