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Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures

Author
Balado, L.; Lupon, E.; Figueras, J.; Roca, M.; Isern, E.; Picos, R.
Type of activity
Journal article
Journal
IEEE transactions on circuits and systems I: regular papers
Date of publication
2009-04
Volume
56
Number
4
First page
754
Last page
762
DOI
https://doi.org/10.1109/TCSI.2008.2004342 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4663654&isnumber=4358591 Open in new window
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

Participants