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QUIESCENT CURRENT ANALYSIS AND EXPERIMENTATION OF DEFECTIVE CMOS CIRCUITS

Author
Champac, V.; Rodriguez-Montanes, R.; Figueras, J.; Rubio, A.; Rius, J.
Type of activity
Book chapter
Book
IDDQ TESTING OF VLSI CIRCUITS
First page
51
Last page
62
Publisher
KLUWER ACADEMIC PUBLISHERS GROUP
Date of publication
1993-01
ISBN
0792393155 Open in new window
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
HIPICS - High Performance Integrated Circuits and Systems
QINE - Low Power Design, Test, Verification and Security ICs

Participants