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Approach to the analysis of gate oxide shorts in cmos digital circuits

Author
Figueras, J.; Rubio, A.
Type of activity
Journal article
Journal
Microelectronics reliability
Date of publication
1992-11
Volume
32
Number
11
First page
1509
Last page
1514
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
HIPICS - High Performance Integrated Circuits and Systems
QINE - Low Power Design, Test, Verification and Security ICs

Participants