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Logic testability of defective floating gate cmos latches

Author
Champac, V.; Figueras, J.; Rubio, A.
Type of activity
Journal article
Journal
Electronics Letters
Date of publication
1992-12
Volume
28
Number
25
First page
2305
Last page
2306
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
HIPICS - High Performance Integrated Circuits and Systems
QINE - Low Power Design, Test, Verification and Security ICs

Participants