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A detailed Analysis and Electrical Modeling of Gate Oxide Shorts in MOS Transistors

Author
Segura, J.; Benito, C.; Rubio, A.; Hawkins, C.
Type of activity
Journal article
Journal
Journal of electronic testing. Theory and applications
Date of publication
1996-11
Volume
8
First page
229
Last page
239
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants