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Hrem study of ultra thin titanium films

Autor
Braisaz, T.; Ruterana, T.; Nouet, G.; Komninou, P.; Kehaigas, T.; Karakostas, T.; Poulopoulos, P.; Aggelakeris, M.; Flevaris, N.; Serra, A.
Tipus d'activitat
Article en revista
Revista
Materials research society symposia proceedings
Data de publicació
1997-01
Número
472
Pàgina inicial
391
Pàgina final
396
DOI
https://doi.org/10.1557/PROC-472-391 Obrir en finestra nova
URL
http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8059310&fulltextType=RA&fileId=S194642740023234X Obrir en finestra nova
Resum
High resolution electron microscopy has been used to characterize the structure of ultra thin films of titanium deposited on KBr substrate by Ultra High Vacuum (UHV) electron-gun evaporation. The size of the grains has an order of magnitude of 10 nm whatever the substrate temperature. The observations have been carried out along <1123> zone axis. Some of the grains contain planar defects which were identified as the twin {1011}. The atomic structure of this twin is characterized by a mirror plan...
Grup de recerca
SC-SIMBIO - Sistemes complexos. Simulació discreta de materials i de sistemes biològics

Participants

  • Braisaz, T.  (autor)
  • Ruterana, T Braisaz P  (autor)
  • Nouet, G  (autor)
  • Komninou, Ph  (autor)
  • Kehaigas, Th  (autor)
  • Karakostas, Th  (autor)
  • Poulopoulos, P M Aggelakeris  (autor)
  • Aggelakeris, M.  (autor)
  • Flevaris, N A Serra  (autor)
  • Serra Tort, Ana Maria  (autor)