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Nanocrystalline thin titanium films grow on potassium bromide single cristals

Autor
Braisaz, T.; Ruterana, P.; Nouet, G.; Komninou, P.; Kehaigas, T.; Karakostas, T.; Poulopoulos, P.; Aggelakeris, M.; Flevaris, N.; Serra, A.
Tipus d'activitat
Article en revista
Revista
Thin solid films
Data de publicació
1998-03
Volum
319
Número
1-2
Pàgina inicial
140
Pàgina final
143
DOI
https://doi.org/10.1016/S0040-6090(97)01109-7 Obrir en finestra nova
URL
http://www.sciencedirect.com/science/article/pii/S0040609097011097 Obrir en finestra nova
Resum
High-resolution electron microscopy has been used to characterize the structure of ultra-thin films of titanium deposited on KBr substrate by ultra-high vacuum (UHV) electron-gun evaporation. The size of the grains has an order of magnitude of 10 nm whatever is the substrate temperature. The observations have been carried out along the <112¯3> zone axis. Some of the grains contain planar defects that were identified as the twin {101¯1}. The atomic structure of this twin is characterized by a m...
Paraules clau
High-resolution electron microscopy, Nanocrystalline film, Titanium, Twinning
Grup de recerca
SC-SIMBIO - Sistemes complexos. Simulació discreta de materials i de sistemes biològics

Participants

  • Braisaz, T  (autor)
  • Ruterana, P  (autor)
  • Nouet, G  (autor)
  • Komninou, Ph  (autor)
  • Kehaigas, Th  (autor)
  • Karakostas, Th  (autor)
  • Poulopoulos, P  (autor)
  • Aggelakeris, M  (autor)
  • Flevaris, N  (autor)
  • Serra Tort, Ana Maria  (autor)