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Disconnection arrays in a rhombohedral twin in a-alumina

Author
Lartigue-Korinek, S.; Hagege, S.; Kisielowski, C.; Serra, A.
Type of activity
Journal article
Journal
Philosophical magazine letters
Date of publication
2008-01
Volume
88
Number
10
First page
1569
Last page
1579
DOI
https://doi.org/10.1080/14786430802235804 Open in new window
URL
http://www.tandfonline.com/doi/abs/10.1080/14786430802235804#.VHWk28nQr9Y Open in new window
Abstract
Interfacial defects, such as grain boundary dislocations, play an important role in the creep behavior of alumina. In the present work, interfacial defects are analyzed in detail using a Volterra approach without a reference to a near-coincidence description. We investigate disconnections (boundary steps with dislocation character) in a diffusion-bonded alumina bicrystal, with a misorientation close to the rhombohedral twin, by conventional and atomic resolution electron microscopy. The bicrysta...
Keywords
alumina, dislocations, grain boundary structure, transmission electron microscopy
Group of research
SC-SIMBIO - Complex systems. Computer simulation of materials and biological systems

Participants

  • Lartigue-Korinek, S  (author)
  • Hagege, S  (author)
  • Kisielowski, C  (author)
  • Serra Tort, Ana Maria  (author)