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IDDQ testing: state of the art and future trends

Author
Ferre, A.; Isern, E.; Rius, J.; Rodriguez-Montanes, R.; Figueras, J.
Type of activity
Journal article
Journal
Integration. The VLSI journal
Date of publication
1998-12
Volume
26
Number
1-2
First page
167
Last page
196
DOI
https://doi.org/10.1016/S0167-9260(98)00027-3 Open in new window
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

Participants