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Experimental characterization of CMOS interconnect open defects

Author
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
Type of activity
Journal article
Journal
IEEE transactions on computer-aided design of integrated circuits and systems
Date of publication
2008-01
Volume
27
Number
1
First page
123
Last page
136
DOI
https://doi.org/10.1109/TCAD.2007.907255 Open in new window
URL
http://ieeexplore.ieee.org/document/4358504/ Open in new window
Abstract
Open defects have been intentionally designed in a set of interconnect metal lines. In order to improve the controllability and the observability of the experimental design, a simple bus structure with a scan register followed by a hold register is used to manage the set of interconnect lines. The strength of the open defects has been varied within a realistic range of resistances ranging from a full (complete) open to a weak (low resistance) open by means of broken metal lines and transmission ...
Keywords
Defect-based testing, detectability conditions, open defects, testability of opens
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

Participants