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Experimental characterization of CMOS interconnect open defects

Autor
Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.
Tipus d'activitat
Article en revista
Revista
IEEE transactions on computer-aided design of integrated circuits and systems
Data de publicació
2008-01
Volum
27
Número
1
Pàgina inicial
123
Pàgina final
136
DOI
https://doi.org/10.1109/TCAD.2007.907255 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/document/4358504/ Obrir en finestra nova
Resum
Open defects have been intentionally designed in a set of interconnect metal lines. In order to improve the controllability and the observability of the experimental design, a simple bus structure with a scan register followed by a hold register is used to manage the set of interconnect lines. The strength of the open defects has been varied within a realistic range of resistances ranging from a full (complete) open to a weak (low resistance) open by means of broken metal lines and transmission ...
Paraules clau
Defect-based testing, detectability conditions, open defects, testability of opens
Grup de recerca
CRnE - Centre de Recerca en Ciència i Enginyeria Multiescala de Barcelona
QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat

Participants