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Correction of spatial errors in SMOS brightness temperature images

Author
Wu, L.; Corbella, I.; Torres, F.; Duffo, N.; Martín, M.
Type of activity
Presentation of work at congresses
Name of edition
2011 IEEE International Geoscience and Remote Sensing Symposium
Date of publication
2011
Presentation's date
2011-07
Book of congress proceedings
2011 IEEE International Geoscience & Remote Sensing Symposium: proceedings: July 24-29, 2011 Vancouver, British Columbia, Canada
First page
3752
Last page
3755
Publisher
IEEE
DOI
https://doi.org/10.1109/IGARSS.2011.6050041 Open in new window
Repository
http://hdl.handle.net/2117/16085 Open in new window
URL
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6050041 Open in new window
Abstract
Systematic spatial errors in SMOS brightness temperature images are successfully estimated by using a statistical analysis of measured data. A constant multiplicative mask is derived by averaging spatial errors of a large number of snapshots over the ocean. The mask has been obtained for the aliasfree field of view region without the need of any geophysical model. It can be considered as part of the instrument characterization and is totally independent of the target to measure. When this mask ...
Citation
Wu, L. [et al.]. Correction of spatial errors in SMOS brightness temperature images. A: IEEE International Geoscience and Remote Sensing Symposium. "2011 IEEE International Geoscience & Remote Sensing Symposium Proceedings". Vancouver: IEEE, 2011, p. 3752-3755.
Group of research
RF&MW - Laboratory of RF & microwave systems, devices and materials
RSLAB - Remote Sensing Lab

Participants