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Implementing end-to-end register data-flow continuous self-test

Author
Carretero, J.S.; Chaparro, P.; Abella, J.; Vera, F.J.; Gonzalez, A.
Type of activity
Journal article
Journal
IEEE transactions on computers
Date of publication
2011-08-01
Volume
60
Number
8
First page
1194
Last page
1207
DOI
https://doi.org/10.1109/TC.2010.179 Open in new window
Repository
http://hdl.handle.net/2117/16287 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5551126 Open in new window
Abstract
While Moore's Law predicts the ability of semiconductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in that law. One concern is the verification effort of modern computing systems, which has grown to dominate the cost of system design. On the other hand, technology scaling leads to burn-in phase out. As a result, in-the-field error rate may increase due to both actual errors and latent defects. Whereas data can be protected ...
Citation
Carretero, J. [et al.]. Implementing end-to-end register data-flow continuous self-test. "IEEE transactions on computers", 01 Agost 2011, vol. 60, núm. 8, p. 1194-1207.
Group of research
ARCO - Microarchitecture and Compilers

Participants

  • Carretero Casado, Javier Sebastian  (author)
  • Chaparro, Pedro  (author)
  • Abella Ferrer, Jaume  (author)
  • Vera Rivera, Francisco Javier  (author)
  • Gonzalez Colas, Antonio Maria  (author)